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The offered EBIC system is an accessory for a scanning electron microscope. It is useful for p-n junction profiling and imaging. The low noise EBIC system includes:
Specimen holder with 3 probes for electrical contacts.
Low-noise current pre-amplifier
Digital multi-meter with serial and GPIB ports.
User-friendly software for data acquisition, plotting, and fitting
Test sample
19 inch electronic equipment rack with mounting kit
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